Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...

From paints and inks to catalysts and drug-delivery materials, many advanced technologies rely on substances dispersed in ...

In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.

TEM works by transmitting a beam of electrons through an ultra-thin specimen. As the electrons interact with the specimen, they are scattered or transmitted, producing an image that is magnified and ...

For materials scientists, understanding the atomic structure of a material, revealing defects, or characterizing the chemical and physical processes that occur during the creation of material, are key ...

TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...

Microcrystal electron diffraction (MicroED) has advanced structural methods across a range of sample types, from small molecules to proteins. This cryogenic electron microscopy (cryo-EM) technique ...